Nano Indenter G300

The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm capable of providing a fast, reliable method for acquiring mechanical data on uncut silicon wafers. It permits testing of multiple layers, facilitating product development and failure analysis which can have a significant effect on yield, performance and longevity to devices

Nano Indenter G200

The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters)